The 24th Congress of the International Commission for Optics

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Poster Session

03: Optical Metrology

[P3] 03: Optical Metrology

Tue. Aug 22, 2017 3:30 PM - 5:30 PM Room P (HANA) (4F)

3:30 PM - 5:30 PM

[P3-20] Development of Precise Wavefront Measurement Method for X-Ray Free Electron Laser Focusing System

○T. Inoue 1, S. Matsuyama 1, S. Kawai 1 (1.Osaka Univ. (Japan))

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