The 24th Congress of the International Commission for Optics

講演情報

Poster Session

03: Optical Metrology

[P3] 03: Optical Metrology

2017年8月22日(火) 15:30 〜 17:30 Room P (HANA) (4F)

15:30 〜 17:30

[P3-20] Development of Precise Wavefront Measurement Method for X-Ray Free Electron Laser Focusing System

T. Inoue 1, S. Matsuyama 1, S. Kawai 1 (1.Osaka Univ. (Japan))

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