Resolution of Saturated Excitation Microscopy Approaching 20-nm With the Aid of Highly Nonlinear Response

H.-X. Ding

講演情報

Oral Presentation

05: Advanced Microscopy and Spectroscopy

[Th3F] SLM Joint Symposium: Optical Microscopy Beyond The Limit II

2017年8月24日(木) 15:30 〜 18:00 Room F (MOON LIGHT) (43F)

Session Chair:P. Xi(Peking Univ.), M. Yamanaka(Nagoya Univ.)

17:30 〜 17:45

[Th3F-07] Resolution of Saturated Excitation Microscopy Approaching 20-nm With the Aid of Highly Nonlinear Response

^○H.-X. Ding ¹, K. Mochizuki ², R. Oketani ², K.-Y. Li ¹, G. Deka ¹, K. Fujita ², S.-W. Chu ¹ (1.National Taiwan Univ. (Taiwan), 2.Osaka Univ. (Japan))

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講演情報

[Th3F] SLM Joint Symposium: Optical Microscopy Beyond The Limit II

[Th3F-07] Resolution of Saturated Excitation Microscopy Approaching 20-nm With the Aid of Highly Nonlinear Response

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