ICPE2020

講演情報

Oral Sessions

B-4 Nano-scale surface finishings

[B-4-2] Improvement of Edge Surface Flatness in Polishing of Silicon Wafers

〇Senju Matsui1、Urara Satake1、Toshiyuki Enomoto1 (1.Osaka University)

キーワード:Polishing、Silicon wafer、Flatness