ICPE2020

講演情報

Oral Sessions

D-2 Surface metrologies of nano-scale structures

[D-2-3] Formation of Graphene with Low Pit Density on SiC Assisted by Plasma Oxidation and Its Characterization

〇Makoto Ochi1、Ouki Minami1、Yasuhisa Sano1、Kentaro Kawai1、Kazuya Yamamura1、Kenta Arima1 (1.Osaka University)

キーワード:Characterization、SiC、Plasma oxidation、Transfer、Graphene