D-3 Mechano photonics engineering and optical applications

[D-3-2] Precise wavefront measurement using grating interferometer for sub-10 nm XFEL focusing system

〇Nami Nakamura¹, Jumpei Yamada², Satoshi Matsuyama¹, Takato Inoue¹, Taito Osaka², Hirokatsu Yumoto³, Takahisa Koyama³, Haruhiko Ohashi³, Makina Yabashi^2,3, Tetsuya Ishikawa², Kazuto Yamauchi¹ (1.Osaka University, 2.RIKEN SPring-8 Center, 3.Japan Synchrotron Radiation Research Institute)

Keywords:Measurement、X-ray free electron laser、advanced Kirkpatrick Baez (AKB) mirror、X-ray single-grating interferometer、Talbot effect