D-3 Mechano photonics engineering and optical applications

[D-3-2] Precise wavefront measurement using grating interferometer for sub-10 nm XFEL focusing system

〇Nami Nakamura¹、Jumpei Yamada²、Satoshi Matsuyama¹、Takato Inoue¹、Taito Osaka²、Hirokatsu Yumoto³、Takahisa Koyama³、Haruhiko Ohashi³、Makina Yabashi^2,3、Tetsuya Ishikawa²、Kazuto Yamauchi¹ (1.Osaka University、2.RIKEN SPring-8 Center、3.Japan Synchrotron Radiation Research Institute)

キーワード：Measurement、X-ray free electron laser、advanced Kirkpatrick Baez (AKB) mirror、X-ray single-grating interferometer、Talbot effect