*Tae-Hyeon Kil¹, Koji Kita¹ (1. Univ. of Tokyo(Japan))

*Nannan You^1,2, Shengkai Wang^1,2, Jilong Hao^1,2, Yun Bai^1,2, Xinyu Liu^1,2 (1. Institute of Microelectronics of the Chinese Academy of Sciences(China), 2. University of Chinese Academy of Sciences(China))

*Xiuyan Li^1,2, Mengjun Li², Tianning Cui¹, Sang Soo Lee³, Sylvie Rangan², Alexi Aermakov², Timothy T. Fister³, Torgny Gustfsson², Eric Garfunkel², Paul Fenter³, Leonard C. feldman² (1. Shanghai Jiao Tong Univ.(China), 2. Rutgers Univ.(United States of America), 3. Argonne National Lab.(United States of America))

*Koichi Murata¹, Daisuke Mori², Aki Takigawa², Hidekazu Tsuchida¹ (1. Central Research Institute of Electric Power Industry (CRIEPI)(Japan), 2. Fuji Electric Co., Ltd.(Japan))

*Keita Tachiki¹, Tsunenobu Kimoto¹ (1. Kyoto Univ.(Japan))