ICSCRM2019

セッション情報

Oral Presentation

Characterization and Defect Engineering

[Tu-1B] Extended Defects I

2019年10月1日(火) 08:45 〜 10:15 Annex Hall 2 (Kyoto International Conference Center)

09:15 〜 09:30

*Fumihiro Fujie1, Shunta Harada1,2, Hiromasa Suo3,4, Tomohisa Kato4, Toru Ujihara1,2,5 (1. Department of Materials Process and Eng., Nagoya Univ.(Japan), 2. Center for Integrated Res. of Future Electronics (CIRFE), Inst. of Materials and Systems for Sustainability (IMaSS), Nagoya Univ.(Japan), 3. Showa Denko K. K.(Japan), 4. National Inst. of Advanced Indus. Sci. and Tech. (AIST)(Japan), 5. GaN Advanced Device Open Innovation Lab. (GaN-OIL), National Inst. of Advanced Indus. Sci. and Tech. (AIST)(Japan))

10:00 〜 10:15

*Nadeemullah A Mahadik1, Robert E Stahlbush1, Stanislav Stoupin2, Hrishikesh Das3, Peter Bonanno1, Albert Macrander4 (1. Naval Research Laboratory(United States of America), 2. Cornell High Energy Synchrotron Source, Cornell Univ.(United States of America), 3. On Semiconductor(United States of America), 4. Argonne National Lab.(United States of America))

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