*Yuichiro Tokuda¹, N. Hoshino², H. Kuno¹, H. Uehigashi¹, T. Okamoto¹, T. Kanda¹, N. Ohya¹, I. Kamata², H. Tsuchida² (1. DENSO CORPORATION(Japan), 2. Central Research Institute of Electric Power Industry (CRIEPI)(Japan))

*Norihiro Hoshino¹, Isaho Kamata¹, Takahiro Kanda³, Yuichiro Tokuda³, Naohiro Sugiyama^2,3, Hironari Kuno³, Hidekazu Tsuchida¹ (1. CRIEPI(Japan), 2. AIST(Japan), 3. DENSO CORP.(Japan))

*Can Zhu¹, Tomoki Endo¹, Takama Unno¹, Haruhiko Koizumi¹, Shunta Harada¹, Miho Tagawa¹, Toru Ujihara^1,2 (1. Nagoya Univ.(Japan), 2. National Inst.of Advanced Indus. Sci. and Tech.(Japan))

Xinming Xing¹, Takeshi Yoshikawa², *Didier Chaussende¹ (1. Univ. Grenoble Alpes, CNRS, SIMAP(France), 2. The Univ. of Tokyo, Inst. of Industrial Sci.(Japan))

*TAKAMA UNNO¹, CAN ZHU², SHUNTA HARADA^1,2, HARUHIKO KOIZUMI^2,4, MIHO TAGAWA^1,2, TORU UJIHARA^1,2,3 (1. Department of Materials Process and Eng., Nagoya Univ.(Japan), 2. Center for Integrated Res. of Future Electronics (CIRFE), Inst. of Materials and System for Sustainability (IMaSS), Nagoya Univ.(Japan), 3. GaN Advanced Device Open Innovation Lab. (GaN-OIL), National Inst. of Advanced Indus. Sci. and Tech. (AIST)(Japan), 4. Department of Electorical and Electronic Eng., Mie Univ.(Japan))