10:30 〜 11:00
*Yoshiyuki Yonezawa1, K. Nakayama1, R. Kosugi1, S. Harada1, K. Kojima1, T. Kato1, H. Tsuchida2, T. Kimoto3, H. Okumura1 ( 1. National Institute of Advanced Industrial Science and Technology(AIST)(Japan), 2. Central Research Institute of Electric Power Industry(Japan), 3. Department of Electronic Science & Engineering, Kyoto University(Japan))