ICSCRM2019

Session information

Oral Presentation

Characterization and Defect Engineering

[Fr-3B] Device-related Characterization

Fri. Oct 4, 2019 1:00 PM - 2:15 PM Annex Hall 2 (Kyoto International Conference Center)

1:45 PM - 2:00 PM

*Patrick Fiorenza1, Mario S. Alessandrino2, Beatrice Carbone2, Clarice Di Martino2, Alfio Russo2, Mario Saggio2, Carlo Venuto2, Edoardo Zanetti2, Corrado Bongiorno1, Filippo Giannazzo1, Fabrizio Roccaforte1 (1. Consiglio Nazionale delle Ricerche - Istituto per la Microelettronica e Microsistemi, Catania(Italy), 2. STMicroelectronics, Catania(Italy))

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