1:00 PM - 1:15 PM
*Dmitry Yu Fedyanin1, Igor A. Khramtsov1, Andrey A. Vyshnevyy1 (1. Moscow Institute of Physics and Technology(Russia))
Oral Presentation
Characterization and Defect Engineering
Fri. Oct 4, 2019 1:00 PM - 2:15 PM Annex Hall 2 (Kyoto International Conference Center)
1:00 PM - 1:15 PM
*Dmitry Yu Fedyanin1, Igor A. Khramtsov1, Andrey A. Vyshnevyy1 (1. Moscow Institute of Physics and Technology(Russia))
1:15 PM - 1:30 PM
*Ryan J. Waskiewicz1, Brian R. Manning1, Duane J. McCrory1, Patrick M. Lenahan1 (1. The Pennsylvania State Univ.(United States of America))
1:30 PM - 1:45 PM
*Sarah Rugen1, Nando Kaminski1, Siddarth Sundaresan2, Ranbir Singh2 (1. Univ. of Bremen(Germany), 2. GeneSiC Semiconductor(United States of America))
1:45 PM - 2:00 PM
*Patrick Fiorenza1, Mario S. Alessandrino2, Beatrice Carbone2, Clarice Di Martino2, Alfio Russo2, Mario Saggio2, Carlo Venuto2, Edoardo Zanetti2, Corrado Bongiorno1, Filippo Giannazzo1, Fabrizio Roccaforte1 (1. Consiglio Nazionale delle Ricerche - Istituto per la Microelettronica e Microsistemi, Catania(Italy), 2. STMicroelectronics, Catania(Italy))
2:00 PM - 2:15 PM
*Keisuke Nagaya1, Takashi Hirayama1, Takeshi Tawara2,3, Koichi Murata4, Hidekazu Tsuchida4, Akira Miyasaka5, Kazutoshi Kojima3, Tomohisa Kato3, Hajime Okumura3, Masashi Kato1 (1. Nagoya Inst.(Japan), 2. Fuji Electric Co., Ltd.(Japan), 3. AIST(Japan), 4. CRIEPI(Japan), 5. Showa Denko(Japan))
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