ICSCRM2019

Presentation information

Print

Oral Presentation

Characterization and Defect Engineering

[Fr-3B] Device-related Characterization

Fri. Oct 4, 2019 1:00 PM - 2:15 PM Annex Hall 2 (Kyoto International Conference Center)

1:00 PM - 1:15 PM

[Fr-3B-01] Ultrabright Single-Photon Emission from Color Centers in Silicon Carbide under Electrical Excitation

*Dmitry Yu Fedyanin1, Igor A. Khramtsov1, Andrey A. Vyshnevyy1 (1. Moscow Institute of Physics and Technology(Russia))