ICSCRM2019

講演情報

Oral Presentation

Characterization and Defect Engineering

[Fr-3B] Device-related Characterization

2019年10月4日(金) 13:00 〜 14:15 Annex Hall 2 (Kyoto International Conference Center)

13:00 〜 13:15

[Fr-3B-01] Ultrabright Single-Photon Emission from Color Centers in Silicon Carbide under Electrical Excitation

*Dmitry Yu Fedyanin1, Igor A. Khramtsov1, Andrey A. Vyshnevyy1 (1. Moscow Institute of Physics and Technology(Russia))