[Mo-P] Poster Presentation

[Mo-P-23] Interest of using a micro-meter spatial resolution to study SiC semi-conductor devices by Optical Induced Current (OBIC)

Camille Sonneville^1,2,3, *Dominique Planson^1,2,3, Luong-Viet Phung^1,2,3, Pascal Bevilacqua^1,2,3, Besar Asllani^1,2,3 (1. Univ Lyon(France), 2. INSA Lyon(France), 3. Ampere Lab(France))