[Mo-P] Poster Presentation

[Mo-P-53] High Temperature Measurement Techniques with Ni/SiC Schottky Diodes, Based on Forward Voltage Difference

*Gheorghe Brezeanu¹, Gheorghe Pristavu¹, Florin Draghici¹, Marian Badila¹, Razvan Pascu², Ion Rusu¹, Oana Tutunaru² (1. Univ. Politehnica of Bucharest(Romania), 2. National Inst. for Research and Development in Microtechnologies(Romania))