ICSCRM2019

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Oral Presentation

Packaging and Applications

[Th-1A] Testing and Radiation

Thu. Oct 3, 2019 8:45 AM - 10:15 AM Room A (Kyoto International Conference Center)

8:45 AM - 9:15 AM

[Th-1A-01(Invited)] Accelerated Testing of SiC Power Devices for Predicting Device Lifetime under High-Field Operating Conditions

Daniel J Lichtenwalner1, Shadi Sabri1, Edward Van Brunt1, Brett Hull1, Sei-Hyung Ryu1, Jae-Hyung Park1, Satyaki Ganguly1, *Donald A. Gajewski1, Scott Allen1, John W. Palmour1 (1. Wolfspeed, a Cree Company(United States of America))