[Th-1A] Testing and Radiation

[Th-1A-01(Invited)] Accelerated Testing of SiC Power Devices for Predicting Device Lifetime under High-Field Operating Conditions

Daniel J Lichtenwalner¹, Shadi Sabri¹, Edward Van Brunt¹, Brett Hull¹, Sei-Hyung Ryu¹, Jae-Hyung Park¹, Satyaki Ganguly¹, *Donald A. Gajewski¹, Scott Allen¹, John W. Palmour¹ (1. Wolfspeed, a Cree Company(United States of America))