ICSCRM2019

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Oral Presentation

Packaging and Applications

[Th-1A] Testing and Radiation

Thu. Oct 3, 2019 8:45 AM - 10:15 AM Room A (Kyoto International Conference Center)

9:15 AM - 9:30 AM

[Th-1A-02] Aging and failure mechanisms of SiC Power MOSFETs under repetitive short-circuit pulses of different duration

*Alberto Castellazzi1, Alessandro Borghese3, Francois Boige2, Vanessa Chazal4 (1. University of Nottingham(UK), 2. LAPLACE - University of Toulouse(France), 3. University of Naples "Federico II"(Italy), 4. THALES(France))