ICSCRM2019

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Oral Presentation

Packaging and Applications

[Th-1A] Testing and Radiation

Thu. Oct 3, 2019 8:45 AM - 10:15 AM Room A (Kyoto International Conference Center)

10:00 AM - 10:15 AM

[Th-1A-05] Comparative Numerical Analysis of the Robustness of Si and SiC PiN Diodes Against Cosmic Radiation-induced Failure

*Yaren Huang1, Benedikt Lechner1, Gerhard Wachutka1 (1. Technical Univ. of Munich(Germany))