ICSCRM2019

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Characterization and Defect Engineering

[Th-1B] Extended Defects II

Thu. Oct 3, 2019 8:45 AM - 10:15 AM Annex Hall 2 (Kyoto International Conference Center)

9:15 AM - 9:30 AM

[Th-1B-02] From wafers to bits and back again: using deep learning to accelerate the development and characterization of SiC material

*Robert T Leonard1, Matthew Conrad1, Edward Van Brunt1, Jeffrey Giles1, Alexander K Shveyd1, Elif Balkas1 (1. Wolfspeed(United States of America))