ICSCRM2019

講演情報

印刷

Oral Presentation

Characterization and Defect Engineering

[Th-1B] Extended Defects II

2019年10月3日(木) 08:45 〜 10:15 Annex Hall 2 (Kyoto International Conference Center)

10:00 〜 10:15

[Th-1B-05] 2D extended defects interaction: the case of grain boundary and stacking faults in 3C-SiC

*Massimo Zimbone1, Corrado Bongiorno1, Cristiano Calabretta2, Francesco La Via1 (1. CNR-Inst. for Microelectronics and Microsystems (Italy)(Italy), 2. MIFT, Univ. degli studi di Messina(Italy))