Schedule 4 1:45 PM - 3:45 PM [Th-P-14] Verification of Forward Degradation in PiN Diode Using Free-Standing 4H-SiC Epitaxial Layers *Yusuke Miyata1, Hiroaki Okabe1, Tomoaki Furusho1, Kazuya Konishi1, Kenji Hamada1, Hiroshi Watanabe1, Shingo Tomohisa1, Naruhisa Miura1 (1. Mitsubishi Electric Corp.(Japan))