[Th-P] Poster Presentation

[Th-P-24] Evaluation of Interface Traps Type, Energy Level and Density by C-V Measurements for Calibrated SiC MOSFET TCAD Simulations

Ilaria Matacena¹, *Luca Maresca¹, Michele Riccio¹, Andrea Irace¹, Giovanni Breglio¹, Santolo Daliento¹ (1. University of Naples "Federico II"(Italy))