Schedule 3 1:45 PM - 3:45 PM [Th-P-24] Evaluation of Interface Traps Type, Energy Level and Density by C-V Measurements for Calibrated SiC MOSFET TCAD Simulations Ilaria Matacena1, *Luca Maresca1, Michele Riccio1, Andrea Irace1, Giovanni Breglio1, Santolo Daliento1 (1. University of Naples "Federico II"(Italy))