2019年10月3日(木) 13:45 〜 15:45Annex Hall 1 (Kyoto International Conference Center)
スケジュール
3
13:45 〜 15:45
[Th-P-32] Rapid Growth of SiO2 on SiC with Atomically Flat Interface and Low Dit using High Pressure Microwave Oxygen Plasma
*Shengkai Wang1,2, Jilong Hao1,2, Nannan You1,2, Yun Bai1,2, Xinyu Liu1,2(1. Inst. of Microelectronics of Chinese Academy of Sciences(China), 2. Univ. of Chinese Academy of Sciences(China))