[Th-P] Poster Presentation

[Th-P-37] Avalanche Ruggedness Assessment of 1.2kV 45mΩ Asymmetric Trench SiC MOSFETs

*Xiao Chuan Deng¹, Hao Zhu¹, Xuan Li¹, Xiao Jie Xu¹, Kun Zhou², Zhi Qiang Li², Bo Song³, You Run Zhang¹, Bo Zhang¹ (1. University of Electronic Science and Technology of China(China), 2. China Academy of Engineering Physics(China), 3. Nanjing Electronic Device Institute(China))