Thu. Oct 3, 2019 1:45 PM - 3:45 PMAnnex Hall 1 (Kyoto International Conference Center)
Schedule
2
1:45 PM - 3:45 PM
[Th-P-41] Short Circuit Ruggedness of 600 V SiC Trench JFETs
*Vinoth Kumar Sundaramoorthy1, Lukas Kranz1, Stephan Wirths1, Marco Bellini1, Gianpaolo Romano1, Enea Bianda1, Lars Knoll1, Andrei Mihaila1(1. ABB Switzerland Ltd(Switzerland))