Thu. Oct 3, 2019 1:45 PM - 3:45 PMAnnex Hall 1 (Kyoto International Conference Center)
Schedule
2
1:45 PM - 3:45 PM
[Th-P-42] Effects of Pulsed and DC Body Diode Current Stress on the Stability of 1200-V SiC MOSFET I-V Characteristics
*Ronald Green Green1, Aivars J Lelis1, Franklin L Nouketcha1,2(1. U.S. Army Research Laboratory(United States of America), 2. University of Maryland(United States of America))