2019年10月3日(木) 13:45 〜 15:45Annex Hall 1 (Kyoto International Conference Center)
スケジュール
2
13:45 〜 15:45
[Th-P-45] Systematic analysis and optimization of Silicon Carbide ultra-thin (<2um) x-ray sensors for synchrotrons beam position monitors applications
*Maria Carulla1, Selam Nida2, Alexander tsibizov2, Thomas Ziemann2, Mario Birri1, Beat Meyer1, Daniel Grolimund1, Claude Pradervand1, Oliver Bunk1, Ulrike Grossner2, Massimo Camarda Camarda1(1. Paul Scherrer Inst.(Switzerland), 2. ETH Zurich, Advance Power Semiconductor Lab.(Switzerland))