ICSCRM2019

講演情報

印刷

Oral Presentation

Characterization and Defect Engineering

[Tu-3B] Quantum Technology II

2019年10月1日(火) 13:45 〜 15:45 Annex Hall 2 (Kyoto International Conference Center)

15:30 〜 15:45

[Tu-3B-07] Enhancement of ODMR Contrasts of Silicon Vacancy in SiC by Thermal Treatment

*Yoji Chiba1,2, Yuichi Yamazaki2, Shin-ichiro Sato2, Takahiro Makino2, Naoto Yamada2, Takahiro Satoh2, Yasuto Hijikata1, Takeshi Ohshima2 (1. Saitama Univ.(Japan), 2. QST(Japan))