スケジュール 1 16:15 〜 18:15 [Tu-P-26] Ultrafast pulsed I-V and charge pumping interface characterization of low-voltage n-channel SiC MOSFETs *Mattias Ekstrom1, B. Gunnar Malm1, Carl-Mikael Zetterling1 (1. KTH Royal Institute of Technology(Sweden))