2019年10月1日(火) 16:15 〜 18:15Annex Hall 1 (Kyoto International Conference Center)
スケジュール
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16:15 〜 18:15
[Tu-P-43] Analyzing 4H-SiC JBS diodes by TCAD process simulation using accurate implantation conditions
*Jonas Buettner1, Susanne Beuer1, Silke Petersen1, Tobias Erlbacher1, Anton Bauer1(1. Fraunhofer Institute for Integrated Systems and Device Technology IISB(Germany))