[Tu-P] Poster Presentation

[Tu-P-52LN] Optically Active Defects at the SiC/SiO₂ Interface

*Brett Cameron Johnson¹, J. Woerle^2,3, D. Haasmann⁴, C. Lew¹, R. A. Parker¹, H. Knowles⁵, B. Pingault⁵, M. Atature⁵, A. Gali^6,7, S. Dimitrijev⁴, M. Camarda^2,3, J. C. McCallum¹ (1. Univ. of Melbourne(Australia), 2. Paul Scherrer Inst.(Switzerland), 3. ETH Zurich(Switzerland), 4. Griffith Univ.(Australia), 5. Univ. of Cambridge(UK), 6. Hungarian Academy of Sciences(Hungary), 7. Budapest Univ. of Technology and Economics(Hungary))