[Tu-P] Poster Presentation

[Tu-P-54LN] Investigation into the Body Diode Degradation of 6.5 kV SiC MOSFETs

*Enea Bianda¹, Andrei Mihaila¹, Gianpaolo Romano¹, Lars Knoll¹, Stephan Wirths¹, Daniele Torresin¹ (1. ABB(Switzerland))