Schedule 0 4:15 PM - 6:15 PM [Tu-P-55LN] Failure Analysis of the SiC Clamp Diodes by 10kA/cm2 Avalanche Current *Masayuki Yamamoto1,2, Kunio Koseki1, Koji Nakayama1, Yasunori Tanaka1 (1. AIST(Japan), 2. Univ. of Yamanashi(Japan))