[Tu-P] Poster Presentation

[Tu-P-55LN] Failure Analysis of the SiC Clamp Diodes by 10kA/cm² Avalanche Current

*Masayuki Yamamoto^1,2, Kunio Koseki¹, Koji Nakayama¹, Yasunori Tanaka¹ (1. AIST(Japan), 2. Univ. of Yamanashi(Japan))