Schedule 6 11:30 AM - 11:45 AM [We-2B-03] High Reliable 4H-SiC Epitaxial Wafer with BPD Free Recombination-Enhanced Buffer Layer for High Current Applications *Hironori Itoh1, Taro Enokizono1, Takaya Miyase1, Tsutomu Hori1, Keiji Wada1, Hideyuki Doi1, Masaki Furumai1 (1. Sumitomo Electric Industries, Ltd.(Japan))