ICSCRM2019

講演情報

Oral Presentation

Characterization and Defect Engineering

[We-3B] Fundamental Physics and Measurement Techniques

2019年10月2日(水) 13:45 〜 15:45 Annex Hall 2 (Kyoto International Conference Center)

15:30 〜 15:45

[We-3B-07] Photocurrent induced by Franz-Keldysh effect in 4H-SiC p-n junction diodes under high electric field along <11-20> direction

*Takuya Maeda1, Xilun Chi1, Hajime Tanaka1, Masahiro Horita1,2, Jun Suda1,2, Tsunenobu Kimoto1 (1. Kyoto University(Japan), 2. Nagoya University(Japan))