[We-P] Poster Presentation

[We-P-37] Near interface oxide traps investigations using dual sweep C-V characteristics for grown polyoxides on SiC

*Razvan Pascu¹, Cosmin Romanitan¹, Mihaela Kusko¹, Gheorghe Pristavu², Florin Draghici², Gheorghe Brezeanu² (1. National Institute for Research and Development in Microtechnologies - IMT Bucharest(Romania), 2. University “POLITEHNICA” Bucharest(Romania))