2019年10月2日(水) 16:15 〜 18:15Annex Hall 1 (Kyoto International Conference Center)
スケジュール
2
16:15 〜 18:15
[We-P-42] Experimental Analysis of 600V 4H-SiC Vertical and Lateral MOSFETs Fabricated on the same 6-inch Substrate using a Single Process
*Nick Yun1, Justin Lynch1, Woongje Sung1(1. State University of New York Polytechnic Inst. Colleges of Nanoscale Science and Engineering(United States of America))