Wed. Oct 2, 2019 4:15 PM - 6:15 PMAnnex Hall 1 (Kyoto International Conference Center)
Schedule
2
4:15 PM - 6:15 PM
[We-P-42] Experimental Analysis of 600V 4H-SiC Vertical and Lateral MOSFETs Fabricated on the same 6-inch Substrate using a Single Process
*Nick Yun1, Justin Lynch1, Woongje Sung1(1. State University of New York Polytechnic Inst. Colleges of Nanoscale Science and Engineering(United States of America))