[We-P] Poster Presentation

[We-P-54LN] Mechanisms of Heavy Ion Induced Single Event Burnout in 4H-SiC Power MOSFETs

*Joseph McPherson¹, Collin Hitchcock¹, Tat-Sing Paul Chow¹, Wei Ji¹ (1. Rensselaer Polytechnic Inst.(United States of America))