[OLED6] OLED Advanced Technologies

[OLED6-2] Ultra High Resolution Imaging Light Measurement Device for Subpixel Metrology of µ-LEDs and OLED-Displays

*Tobias Steinel¹, Thilo Gemeinhardt¹, Martin Wolf¹ (1. Instrument Systems GmbH (Germany))

キーワード：µ-LED, subpixel metrology, ultra high resolution, display testing, light measurement device

We present ultra-high resolution measurements of (Micro-) OLED displays for subpixel metrology in display production and laboratories. A 150 megapixel camera merged with a high-end spectroradiometer allows for one-shot subpixel analysis of complete displays with spectroradiometric accuracy. An integrated pixel-shifter increases resolution to effectively 600 megapixels.