The 26th International Display Workshops (IDW '19)

講演情報

Poster Presentation

[OLEDp1] OLED poster

2019年11月28日(木) 10:40 〜 13:10 Main Hall (1F)

10:40 〜 13:10

[OLEDp1-7] A Study of Encapsulation Structure for TFT Reliability in Top Emission OLED Display

*Jae Young Oh1, Seung Hee Nam1, Kwon-Shik Park1, SooYoung Yoon1, InByeong Kang1, Jae Kyeong Jeong2 (1. LG Display (Korea), 2. Hanyang University (Korea))

キーワード:encapsulation, oxide, hydrogen, multilayer

Preventing hydrogen and water vapor from permeating through encapsulation layer plays an important role in TFT Reliability. To improve a blocking characteristic, encapsulation inorganic layers were studied. A SiNx and SiO2 multilayered inorganic deposition method for OLED has been developed to obtain a reliable performance.