[TuP] Poster

[TuP-43] Testing a Generalized Siegert Relation for Characterizing
Semiconductor Nanolaser Emission

Monty Drechsler¹, *Frederik Lohof¹, Christopher Gies¹ (1. Univ. of Bremen (Germany))

Presentation style: On-site (in-person)

キーワード：Nanolaser, quantum optics, photon correlations