*Wan-Yu Wu¹, Ying-Hsiang Lin², Po-Liang Liu², Dong-Sing Wuu^3,4 (1. Department of Materials Science and Engineering, National United University, Taiwan, 2. Institute of Precision Engineering, National Chung Hsing University, Taiwan, 3. Department of Applied Materials and Optoelectronic Engineering, National Chi Nan University, 4. Department of Materials Science and Engineering, National Chung Hsing University, Taiwan)

*Yuuki Tokuta¹, Yasuyoshi Saito¹, Yoshikazu Teranishi¹, Taishi Uehara², Satoru Habuka³, Ryo Sakamoto⁴, Tomohiro Kato⁴, Tetsuhide Shimizu⁴ (1. Tokyo metropolitan industrial technology research institute, 2. DOWA HOLDINGS Co., Ltd., 3. DOWA THERMOTECH Co., Ltd., 4. Tokyo Metropolitan University)

*Katarína Viskupová¹, Branislav Grančič¹, Tomáš Fiantok², Peter Švec Jr.³, Štefan Nagy³, Tomáš Roch¹, Leonid Satrapinskyy¹, Martin Truchlý², Viktor Šroba¹, Peter Kúš¹, Marián Mikula^1,3 (1. Department of Experimental Physics; Faculty of Mathematic, Physics and Informatics; Comenius University in Bratislava; Slovakia, 2. Detached Workplace of Faculty of Mathematics, Physics and Informatics; Comenius University; Bratislava; Turany; Slovakia, 3. Institute of Materials and Machine Mechanics; Slovak Academy of Sciences; Bratislava; Slovakia)

*Anna Wiktoria Oniszczuk¹, Wojciech Gajewski¹, Piotr Różański¹, Wojciech Trzewiczyński¹, Paweł Ozimek¹ (1. TRUMPF Huettinger Sp. z o.o.)

*IVAN FERNANDEZ¹ (1. NANO4ENERGY SLNE)