10:00 AM - 10:20 AM
[2023-w-04] Feasibility study on Quality Assurance Method for “Minimal Fab”
Keywords:Semiconductor ICs, Minimal Fab, Quality assurance method
Oral Session
w) Safety and Mission Assurance
Wed. Jun 7, 2023 9:00 AM - 10:20 AM Stadio 4F-2 (Stadio 4F-2)
Ryoji Kobayashi (JAXA), Koji Oga (Manned Space Systems Co., Ltd.)
10:00 AM - 10:20 AM
Keywords:Semiconductor ICs, Minimal Fab, Quality assurance method