*Martin Wuest¹ (1. INFICON AG (Liechtenstein))

*Stefan Kiesel¹, Andreas Truetzschler¹, Christian Voigtlaender², Christoph Bartlitz¹, Eric Lindner², Michael Flaemmich¹, Klaus Bergner¹ (1. VACOM Vakuum Komponenten & Messtechnik GmbH (Germany), 2. FBGS Technologies GmbH (Germany))

*Tim Verbovsek¹, Janez Setina¹ (1. Institute of Metals and Technology (Slovenia))

*Tom Moses Rubin¹, Ove Axner¹⁰, Domenico Mari⁵, Christian Günz¹, Zaccaria Silvestri³, André Kussicke¹, Bentouati Djilali⁶, Bogumil Jeziorski¹¹, Carmen García Izquierdo², Clayton Forssén^10,7, David Szabo⁷, Giovanni Garberoglio⁸, Isak Silander¹⁰, Janez Šetina⁴, Johan Zakrisson¹⁰, Martin Zelan⁷, Oleg Polyansky⁹, Pascal Gambette³, Roberto Gavioso⁵, Sergio Molto González² (1. Physikalisch-Technische Bundesanstalt (PTB) (Germany), 2. Centro Español de Metrología (CEM) (Spain), 3. Conservatoire national des arts et métiers (CNAM) (France), 4. Institut za Kovinske Materiale in Tehnologije (IMT) (Slovenia), 5. Istituto Nazionale di Ricerca Metrologica (INRiM) (Italy), 6. Laboratoire national de métrologie et d'essais (LNE) (France), 7. Research Institutes of Sweden AB (RISE) (Sweden), 8. Fondazione Bruno Kessler (FBK) (Italy), 9. University College London (UCL) (UK), 10. Umeå Universitet (UmU) (Sweden), 11. Uniwersytet Warszawski (UW) (Poland))

*Yoshinori Takei¹, Hajime Yoshida¹, Souichi Telada¹, Youichi Bitou¹, Tokihiko Kobata¹ (1. National Institute of Advanced Industrial Science and Technology (AIST)/National Metrology Institute of Japan (NMIJ) (Japan))

*Jacob Ricker¹, Kevin Douglass¹, Jay Hendricks¹, Sarah White², Sergei Syssoev² (1. National Institute of Standard and Technology (NIST) - USA (United States of America), 2. MKS Instruments Inc., Andover, MA USA (United States of America))