IVC-22

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Parallel Sessions

Scanning Probe Microscopy

[Mon-C2] Scanning Probe Microscopy

Mon. Sep 12, 2022 3:30 PM - 5:30 PM Room C (Mid-sized Hall A)

3:45 PM - 4:00 PM

[Mon-C2-2] Simultaneous surface charge density and elasticity mapping by force mapping using frequency-modulation AFM in liquids

*Hiroaki Kominami1, Kei Kobayashi1, Hirofumi Yamada1 (1. Kyoto University (Japan))

Keywords:AFM, force mapping

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